The ERAI has announced a new workshop to be featured at the ERAI Executive Conference: ERAI Executive Conference Featured Workshop - New Algorithms to Improve X-Ray Imaging with instructor Dr. Bill Cardoso.
The drive towards miniaturization has created increasing challenges to the overall failure analysis, quality inspection, and counterfeit detection of electronic devices. This trend has equally challenged the image quality of x-ray inspection systems – engineers need to see more details in each inspection. Image quality is paramount to the ability of making actionable decisions on the information acquired from an x-ray machine. Previous generations of x-ray technologies have focused on hardware improvements – better x-ray sources and better x-ray sensors. Although further improvements can still be achieved in hardware, our focus will be on the latest wave of technology breakthroughs and innovation in radiography systems: algorithms.
Algorithms have been paramount in enabling the inspection of challenging electronics assemblies. From computed tomography to dual energy algorithms, these special pieces of software may be the difference between finding and not finding that issue with your sample. In this presentation we will go behind the curtains and see how these algorithms are designed. The examples presented will illustrate real life situations that show the extent of the use of algorithms in radiography for failure analysis and quality control.